Albert Polman wins MRS 'Innovation in Materials Characterization Award'

7 May 2014

UvA physicist and AMOLF group leader Albert Polman received the 2014 Innovation in Materials Characterization Award during the annual meeting of the Materials Research Society (MRS), held in San Fransisco from 21-24 April.

Polman received the award “for the development, application and commercialization of Angle-Resolved Cathodoluminescence Imaging Spectroscopy (ARCIS) as a new tool for optical imaging at the nanoscale, with applications in nanophotonics and materials science in general.” 

Albert Polman is a Professor of Photonic Materials at the UvA and group leader at the Foundation for Fundamental Research’s (FOM) AMOLF institute.

According to the MRS, the award “honors an outstanding advance in materials characterization that notably increases knowledge of the structure, composition, in situ behavior under outside stimulus, electronic behavior, or other characterization feature, of materials. Polman was chosen from a large group of extraordinary nominees.” The award consists of an engraved trophy and a cash prize of $5,000 and was presented to Polman during the 2014 MRS Spring Meeting, held in San Francisco from 21-24 April.

The ARCIS instrument developed at AMOLF has been brought on the market by the start-up company Delmic. An editorial article on the new instrument appeared in Nature in 2013 (Nature 493, 143 (2013)). See also: www.erbium.nl/arcis.html

MRS

The MRS is an international organization of materials researchers from academia, industry and government that promotes communication for the advancement of interdisciplinary materials research; it has over 16.000 members.

AMOLF

Published by  IOP